Low Temperature Test
Details
China Electronics / Computers
Electronics / Computers

Low Temperature Test

Quantity : 100   Price : 100-10000

Low temperature test: The temperature during the test is not changed under a certain fixed temperature condition, depending on the actual use environment profile of the product and the purpose of the test.

It can be a storage test or a work test. It can be natural or artificial environmental conditions.

Failure Mechanism Of Low Temperature Test

Test parameters

Main influence

Typical failure results

Low Temperature

Embrittlement; icing; viscosity increase and solidification; the decrease of mechanical strength; physical shrinkage.

Insulation failure, cracking, mechanical failure, increased wear of moving parts due to shrinkage or loss of lubricant performance, failure of seals and seals.

Test Capability of ORT Low Temperature Test

Min. Temperature: -70℃

Applicable standards: IEC 60068-2-1, GB/T 2423.1, MIL-STD-810H, MIL-STD-883K, MIL-STD-202G, GJB 150A, GJB 360B, GJB 548B, GB/T 28046.4, ISO 16750- 4. YD/T 2379, ETSI 300 019-2, GR-63, GR-487, etc.

Low Temperature Test Gallery

As one of tic industry companies, we have types of tic testing for sale, if you have needs, please contact us.

Location : 1/f,Building15,Fangxing Science And Technology Park ,NO6 lnDUSTRIAL ZONE Longgang Street,Longgang District ,Shenzhen., 518116 shenzhen,
Contact : ts szort-, 0755 27817553

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  • 450006 - Henan province
  • 0086 371 68706009
  • 8615890630517